Astrid Kim Babayan, PhD, is CRICO's Data Scientist. She serves as an in-house expert to research, evaluate, and implement advanced analytic techniques for malpractice data evaluation. Prior to joining CRICO as a full time employee, Dr. Babayan provided consulting services to CRICO in SAS programming, data analysis, statistical modeling, and other analytical work needed to support the work of the Patient Safety department. In her current role, she works with large datasets such as the MA All-Payers Claims Database, mentors other team members on quantitative methodologies and has introduced new tools including, JMP, Power Pivot, and Tableau, which have now been incorporated into other's work. Dr. Babayan received her Ph.D. in Industrial Engineering and Operations Research from the University of Illinois at Chicago and her M.S. in Applied Mathematics from Yerevan State University in Armenia.